Fast Incremental Conformance Analysis for Interactive Process Discovery

Dixit, P. M.; Buijs, J. C. A. M.; Verbeek, H. M. W.; van der Aalst, W. M. P.

Cham : Springer International Publishing (2018)
Contribution to a book, Contribution to a conference proceedings

In: Business information systems : 21st International Conference, BIS 2018, Berlin, Germany, July 18-20, 2018 : proceedings / Witold Abramowicz, Adrian Paschke (eds.)
Page(s)/Article-Nr.: 163-175

Identifier