Similarity resonance for improving process model matching accuracy

Assy, Nour; van Dongen, Boudewijn F.; van der Aalst, Wil M. P.

ACM Press New York, New York, USA (2018)
Contribution to a book, Contribution to a conference proceedings

In: Proceedings of the 33rd Annual ACM Symposium on Applied Computing
Page(s)/Article-Nr.: 86-93

Identifier