A general framework to detect behavioral design patterns

Liu, Cong (Corresponding author); van Dongen, Boudewijn (Corresponding author); Assy, Nour (Corresponding author); van der Aalst, Wil M. P. (Corresponding author)

Piscataway, NJ] : IEEE (2018)
Contribution to a book, Contribution to a conference proceedings

In: 2018 ACM/IEEE 40th International Conference on Software Engineering: Software Engineering Education and Training : ICSE-SEET 2018 : 30 May-1 June 2018, Gothenburg, Sweden : proceedings
Page(s)/Article-Nr.: 234-235

Identifier