A general framework to detect behavioral design patterns
Liu, Cong (Corresponding author); van Dongen, Boudewijn (Corresponding author); Assy, Nour (Corresponding author); van der Aalst, Wil M. P. (Corresponding author)
Piscataway, NJ] : IEEE (2018)
Buchbeitrag, Beitrag zu einem Tagungsband
In: 2018 ACM/IEEE 40th International Conference on Software Engineering: Software Engineering Education and Training : ICSE-SEET 2018 : 30 May-1 June 2018, Gothenburg, Sweden : proceedings
Seite(n)/Artikel-Nr.: 234-235
Einrichtungen
- Fachgruppe Informatik [120000]
- Lehrstuhl für Informatik 9 (Process and Data Science) [122510]
Identifikationsnummern
- DOI: 10.1145/3183440.3194947
- RWTH PUBLICATIONS: RWTH-2018-231056