A general framework to detect behavioral design patterns

Liu, Cong (Corresponding author); van Dongen, Boudewijn (Corresponding author); Assy, Nour (Corresponding author); van der Aalst, Wil M. P. (Corresponding author)

Piscataway, NJ] / IEEE (2018) [Buchbeitrag, Beitrag zu einem Tagungsband]

2018 ACM/IEEE 40th International Conference on Software Engineering: Software Engineering Education and Training : ICSE-SEET 2018 : 30 May-1 June 2018, Gothenburg, Sweden : proceedings
Seite(n): 234-235

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