Process Diagnostics Using Trace Alignment: Opportunities, Issues, and Challenges

Jagadeesh Chandra Bose, R. P.; van der Aalst, Wil M. P.

Oxford [u.a.] : Pergamon Press (2012)
Journal Article

In: Information systems : IS
Volume: 37
Issue: 2
Page(s)/Article-Nr.: 117-141

Identifier