Evaluating and Predicting Overall Process Risk Using Event Logs

Pika, A.; van der Aalst, Wil M. P.; Wynn, M. T.; Fidge, C. J.; ter Hofstede, A. H. M.

New York, NY : Elsevier Science Inc. (2016)
Journal Article

In: Information Sciences
Volume: 352/353
Page(s)/Article-Nr.: 98-120

Identifier