Detection and Prediction of Errors in EPCs of the SAP Reference Model

Mendling, J.; Verbeek, H. M. W.; van Dongen, B. F.; van der Aalst, Wil M. P.; Neumann, G.

Amsterdam [u.a.] : Elsevier (2008)
Journal Article

In: Data & knowledge engineering
Volume: 64
Issue: 1
Page(s)/Article-Nr.: 312-329

Identifier