Verification of the SAP Reference Models Using EPC Reduction, State-space Analysis, and Invariants

van Dongen, B. F.; Jansen-Vullers, M. H.; Verbeek, H. M. W.; van der Aalst, Wil M. P.

Amsterdam [u.a.] : Elsevier Science (2007)
Journal Article

In: Computers in industry
Volume: 58
Issue: 6
Page(s)/Article-Nr.: 578-601

Identifier