A Visual Approach to Spot Statistically-Significant Differences in Event Logs Based on Process Metrics

Bolt, A.; de Leoni, M.; van der Aalst, Wil M. P.

Cham / Springer (2016) [Buchbeitrag, Beitrag zu einem Tagungsband]

Advanced Information Systems Engineering : 28th International Conference, CAiSE 2016, Ljubljana, Slovenia, June 13-17, 2016. Proceedings / edited by Selmin Nurcan, Pnina Soffer, Marko Bajec, Johann Eder
Seite(n): 151-166

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