Evaluating and Predicting Overall Process Risk Using Event Logs

Pika, A. (Corresponding author); van der Aalst, Wil M. P.; Wynn, M. T.; Fidge, C. J.; ter Hofstede, A. H. M.

New York, NY : Elsevier Science Inc. (2016)
Journal Article

In: Information Sciences
Volume: 352/353
Page(s)/Article-Nr.: 98-120


  • Department of Computer Science [120000]
  • Chair of Computer Science 9 (Process and Data Science) [122510]