Similarity resonance for improving process model matching accuracy

Assy, Nour (Corresponding author); van Dongen, Boudewijn F. (Corresponding author); van der Aalst, Wil M. P. (Corresponding author)

New York, NY : ACM (2018)
Contribution to a book, Contribution to a conference proceedings

In: Applied computing 2018 : the 33rd Annual ACM Symposium on Applied Computing : Pau, France, April 9-13, 2018 / sponsored by: ACM Special Interest Group on Applied Computing ; conference chairs: Hisham M. Haddad (Kennesaw State University, USA), Roger L. Wainwright (University of Tulsa, USA), Richard Chbeir (University of Pau & Pays Adour, France)
Page(s)/Article-Nr.: 86-93


  • Department of Computer Science [120000]
  • Chair of Computer Science 9 (Process and Data Science) [122510]