A general framework to detect behavioral design patterns

Piscataway, NJ] / IEEE (2018) [Contribution to a book, Contribution to a conference proceedings]

2018 ACM/IEEE 40th International Conference on Software Engineering: Software Engineering Education and Training : ICSE-SEET 2018 : 30 May-1 June 2018, Gothenburg, Sweden : proceedings
Page(s): 234-235

Authors

Selected Authors

Liu, Cong
van Dongen, Boudewijn
Assy, Nour
van der Aalst, Wil M. P.

Identifier